| VRSTA GRADIVA | analitična raven (sestavni del), tekstovno gradivo, tiskano, 1.02 - pregledni znanstveni članek |
| DRŽAVA IZIDA | Slovenija |
| LETO IZIDA | 2001 |
| JEZIK BESEDILA/IZVIRNIKA | angleški |
| PISAVA | latinica |
| DELO IMA | ilustracije |
| AVTOR | Wilson, Richard J. - avtor |
| ODGOVORNOST | Nott, David J. - avtor |
| NASLOV | Review of recent results on excursion set models |
| V PUBLIKACIJI | Image analysis & stereology. - ISSN 1580-3139. - ǂVol. ǂ20, ǂno. ǂ2 (jun. 2001), str. 71-78. |
| KRATKA VSEBINA | Many images consist of two or more "phases", where a phase is a collection of homogeneous zones. For example, the phasesmay represent the presence of different sulphides in an ore sample. Frequently, these phases exhibit very little structure, though all connected components of a given phase may be similar in some sense. As a consequence, random set models are commonly used to model such images. The Boolean model and models derived from the Boolean model are often chosen. An alternative approach to modelling such images is touse the excursion sets of random fields to model each phase. In this paper, the properties ofexcursion sets will be firstly discussed in terms of modelling binary images. Ways of extending these models to multi-phase images will then be explored. A desirable feature of any model is to be able to fit it to data reasonably well. Different methods for fitting random set models based on excursion sets will be presented and some of the difficulties with these methods will be discussed. |
| OPOMBE | Bibliografija: str. 78 // Abstract |
| PREDMETNE OZNAKE | // Image Processing, Computer-Assisted // Models, Theoretical // Normal Distribution // Least-Squares Analysis // Likelihood Functions // Random Allocation // Sulfides // Modeli teoretski // Slika, obdelava z računalnikom // Najmanjši-kvadrati, analiza // Normalna distribucija // Slučajnost, razporeditev // Sulfidi // Verjetnostne funkcije |
| PREDMETNE OZNAKE | // sulfidi // porazdelitev // modeli // verjetnost // analiza slik |
| UDK | 004.93:514.1 |