| VRSTA GRADIVA | analitična raven (sestavni del), tekstovno gradivo, tiskano, 1.01 - izvirni znanstveni članek |
| DRŽAVA IZIDA | Slovenija |
| LETO IZIDA | 2001 |
| JEZIK BESEDILA/IZVIRNIKA | angleški |
| PISAVA | latinica |
| DELO IMA | ilustracije |
| ODGOVORNOST | Donnadieu, Patricia - avtor // Matsuda, Kenji - avtor // Epicier, Thierry - avtor // Douin, Joel - avtor |
| NASLOV | Measurements of strain fields due to nanoscaleprecipitates using the phase image method |
| V PUBLIKACIJI | Image analysis & stereology. - ISSN 1580-3139. - ǂVol. ǂ20, ǂno. ǂ3 (nov. 2001), str. 213-218. |
| KRATKA VSEBINA | Owing the phase image method (Hytch, 1998), strain fields can be derived from HREM images. The method is here applied to the nanoscale precipitates responsible for hardening in Aluminum alloys.Since the method is a very sensitive one, we have examined the impact of several aspects of the image quality (noise, fluctuations, distortion). Thestrain field information derived from the HREM image analysis is further introduced in a simulation of the dislocation motion in the matrix. |
| OPOMBE | Soavtorji: Kenji Matsuda, Thierry Epicier, Joel Douin // Bibliografija: str. 218 // Abstract |
| PREDMETNE OZNAKE | // Aluminum Compounds // Microscopy, Electron// Image Processing, Computer-Assisted // Aluminijeve spojine // Mikroskopija elektronska // Slika, obdelava z računalnikom |
| PREDMETNE OZNAKE | // aluminijeve spojine // elektronska mikroskopija // preiskava materiala |
| UDK | 620.1/.2:004.93 |
| COBISSSI-ID | 1 |