| VRSTA GRADIVA | analitična raven (sestavni del), tekstovno gradivo, tiskano, 1.01 - izvirni znanstveni članek |
| DRŽAVA IZIDA | Slovenija |
| LETO IZIDA | 2013 |
| JEZIK BESEDILA/IZVIRNIKA | angleški |
| PISAVA | latinica |
| DELO IMA | ilustracije |
| ODGOVORNOST | Šedivý, Ondřej - avtor // Beneš, Viktor - avtor // Ponížil, Petr - avtor // Král, Petr - avtor // Sklenička, Václav -avtor |
| NASLOV | Quantitative characterization of microstructure of pure copper processed by ECAP |
| V PUBLIKACIJI | Image analysis & stereology. - ISSN 1580-3139.. - ǂVol. ǂ32, ǂno. ǂ2 (2013), str. 65-75. |
| KRATKA VSEBINA | Orientation imaging microscopy (OIM) allows tomeasure crystallic orientations at the surface of the material. Digitalizeddata representing the orientations are processed to recognize the grain structure and they are visualized in crystal orientation maps. Analysis of the data firstly consists in recognition of grain boundaries followed by identification of grains themselves. Knowing the grain morphology it is possible to characterize the homogeneity of the structure and estimate structural parameters related to the physical properties of the material. The paper describes methods of imaging and quantitative characterization ofthe grain boundary structure in metals based on data from electron backscattered diffraction (EBSD). |
| OPOMBE | Bibliografija: str. 74-75 // Abstract |
| ELEKTRONLOKACIJA/DOSTOP | Dostopno tudi na: http://www.ias-iss.org/ojs/IAS/article/view/949 |
| PREDMETNE OZNAKE | // stereologija // metalografija // baker // EBSD // uklon povratno sipanih elektronov // statistična analiza // electron backscatter diffraction // equal-channel angular pressing // random marked sets // second-order analysis |
| UDK | 004.93:620.18 |
| DOI | 10.5566/ias.v32.p65-75 |